M25PVMN6TP TR Micron Technology Inc. | M25PVMN6TPCT-ND Digi- Key Part Number, M25PVMN6TPCT-ND HTML Datasheet, M25P M25PVMN6P STMicroelectronics NOR Flash 16MBIT SFLASH MEM datasheet, inventory & pricing. Part, M25P Category. Description, 16 Mbit, Low Voltage, Serial Flash Memory With 50 MHZ Spi Bus Interface. Company, ST Microelectronics, Inc. Datasheet.
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The value of the 8-bit Electronic Signature, for the M25P1 6, is 1 4h. The Deep Power-down mode automatically stops at Power-down, and the device always Powers-up in the Standby mode. Absolute maximum ratings 37 Table This prevents the device from going back to the Hold condition.
The Bulk Erase BE instruction is ignored if one, or more, sectors are protected. If datasheett than Data bytes are sent to device, they are correctly programmed at the requested addresses without having any effects on the other bytes of the same page.
Serial input timing 44 Figure Chip Select S can be driven High after any bit of the data-out sequence is being shifted out. When one of these cycles is in progress, it is recommended to check the Write In Progress WIP bit before sending a new instruction to the device.
Note 1 added to Table Protected area sizes 14 Table 3. Information in this document is provided solely in connection with ST products. S01 6 wide – 1 6-lead Plastic Small Outline, mils body width, mechanical data 51 Table Expressed as a slew-rate. Driving Chip Select S High deselects the device, and puts the device datasheett the Standby mode if there is no internal cycle currently in progress. S08N package specifications updated see Figure 29 and Table ICC2 max value changed to 10uA Dec 0.
Soldering temperature information clarified for RoHS compliant devices.
M25P16 Datasheet(PDF) – STMicroelectronics
When using the Page Program PP instruction to program consecutive Bytes, optimized timings are obtained with one sequence including all the Bytes versus several sequences of only a few Bytes. The device then goes in to the Stand-by Power mode. Values are latched on the rising edge of Serial Clock C. The old-style Electronic Signature is supported for reasons of backward compatibility, only, and should not be used for new designs.
Bus master and memory devices on the SPI bus updated and Note 2 added. Bulk Erase BE instruction sequence 31 Figure The designer needs to be aware that if a Power-down occurs while a Write, Program or Erase cycle is in progress, some data corruption can result.
Write Protect setup and hold times specified, for applications that switch Write Protect to exit the Hardware Protection mode immediately before a WRSR, and to enter the Hardware Protection mode again immediately after 1 5-May 0. The logic inside the device is held reset while Vqc is less than the Power On Reset POR threshold voltage, V W – all operations are disabled, and the device does not respond to any instruction.
When set to 1such a cycle is in progress, when reset to 0 no such cycle is in progress. Document revision history Date Revision Changes -i c ion onno U.
Then, the old-style 8-bit Electronic Signature, stored in the memory, is shifted out on Serial Data Output Qeach bit being shifted out during the falling edge of Serial Clock C. LP D AI 1. S wide – lead Plastic Small Outline, mils body width, mechanical data Symbol millimeters inches Typ.
Power-up and Power- down. Operating conditions 38 Table 1 1. Document promoted to full Datasheet.
M25P16 SPI flash memory + LPC1769 – prototype work great, designed PCB not so good…
However, taking this signal Low does not terminate any Write Status Register, Program or Erase cycle that is currently in progress. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted under this document. Document promoted to Preliminary Data.
To spread this overhead, the Page Program PP instruction allows up to bytes to be programmed at a time changing bits from 1 to 0provided that they lie in consecutive addresses on the same datssheet of memory.
If any part of this document refers to any third party products or services it shall not be deemed a license grant by ST for the use of such third party products or services, or any intellectual property contained therein or considered as a warranty covering the use in any manner whatsoever of such third party products or services or any intellectual property contained therein.
Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.