The inverted metallurgical microscope Nikon MA Eclipse is compact and powerful and designed for metallurgical specimen testing. Buhler supplies this. Nikon Eclipse MA April 17, | | 0 Comments. by Leslie Bolin. Share this. Leave a Reply Cancel reply. Categories. “How To” Tutorials (26); @ The. Nikon Instruments, Inc. introduces the Eclipse MA, an inverted materials microscope with an innovative design that has been optimized for.
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In addition, ecllipse MA offers a wide range of contrast methods including episcopic bright field, episcopic dark field, DIC, simple polarizing and episcopic fluorescence. It is now possible to capture even more vivid images due to the improved uniformity of the illumination. Adjacent images can be put together to create an image with a wide field. Basic performance dramatically improved.
In maa200 to printing directly via a PictBridge-compatible printer, you can save data onto a server over a LAN.
If you find a document or resource that does not belong please let us know by emailing info labwrench. The newly developed 1X objective lens enables macro observation with actual field view of 25mm, making it possible to view the whole area of an embedded metallurgical sample.
The observation position of the objective lens and sample can be checked easily from the microscope’s front panel. Eclipse MA The Eclipse MA is an inverted materials microscope with an innovative design that has been optimized for digital imaging and ergonomic efficiency. Delivers ease-of-use by placing all important controls on the front.
The footprint is only one-third of a conventional model! This is crucial when acquiring the optimum settings for observation and image capture.
Nikon MA200 Eclipse Inverted Microscope
All controls are on the front of the instrument. Improved uniformity of illumination delivers clear images, especially for digital imaging.
Automatically detects the address of the objective lens currently in eeclipse and displays it on the main unit front panel. When returning to brightfield observation, the previous field and aperture stop settings are reproduced.
Quantitative illumination adjustment can be made manually by viewing the voltage value. A box shaped microscope, in which not only the width but also the depth is reduced dramatically: Quantitative illumination adjustment, which is crucial when acquiring the optimum settings for observation, image capture and especially large image stitching, can be made via PC control.
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Employs internal turrets that keep dust off the illumination filters, maintaining bright uniform illumination. Also, the power supply is built in to save space. The built-in, high-definition, Provides a more ergonomic and clear image observation. We appreciate the support of individuals and companies making their documents and resources available to our community.
Cutting-edge instruments include microscopes, digital imaging products and software. This feature makes it easy to use the measurement function in the DS-L4.
One third of the space of conventional models Improved durability thanks to the unique box structure. Manuals and Resources Note: Introduces New Research Stereo Microscopes. Super-wide Field of View The ultra wide field of view eyepiece, in combination with the newly developed 1x objective lens, enables a sample eclkpse 25 mm in diameter to be observed in one field of view.
July 7 th0 Replies Post a Reply. Additionally, by combining the Metalo software module grain sizing and cast ironthe system will be optimal for JIS and ASTM standard compliant metallurgical analysis.
Nikon | Industrial Metrology | ECLIPSE MA
Nikon News Press Releases and Articles. The scales size will automatically be calibrated when the objective magnification is changed. News Room Subscribe via: The MA uses integrated intelligence to automatically combine captured images with data on their observation settings for more comprehensive documentation.
NIS-Elements allow the user to perform everything from basic image capture to the measurement, analysis, and management of captured images. Nikon’s very own solution for an ideal microscope. For more information, visit www.